XTemp: Event-driven Testing and Monitoring of Business processes

Leveraging XML, XPath and XSLT for a Practical Event Processing

Jacques Durand

Senior architect, R and D dir.

Fujitsu America, Inc.

Hyunbo Cho

Professor

Pohang University of Science and Technology

Dale Moberg

Senior Scientist

Axway

Jungyub Woo

Researcher

National Institute of Standards and Technology (NIST)

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Proceedings

XTemp: Event-driven Testing and Monitoring of Business processes

Leveraging XML, XPath and XSLT for a Practical Event Processing

Balisage: The Markup Conference 2011
August 2 - 5, 2011

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Slides and Materials

Author's keywords for this paper: Document Testing; Test Assertion